Temperature and chemical effects on the interfacial energy between a Ga–In–Sn eutectic liquid alloy and nanoscopic asperities

• Yujin Han,
• Pierre-Marie Thebault,
• Corentin Audes,
• Xuelin Wang,
• Haiwoong Park,
• Jian-Zhong Jiang and
• Arnaud Caron

Beilstein J. Nanotechnol. 2022, 13, 817–827, doi:10.3762/bjnano.13.72

• interfacial energies between a eutectic Ga–In–Sn liquid alloy and single nanoscopic asperities of SiOx, Au, and PtSi have been determined in the temperature range between room temperature and 90 °C by atomic force spectroscopy. For all asperities used here, we find that the interfacial tension of the eutectic

• and calculate the corresponding work of adhesion Wad as suggested in [19] for solid interfaces. The authors measured the adhesion between atomically smooth quasicrystalline surfaces of TiN-coated AFM tips in ultrahigh vacuum by analyzing the pull-off force during atomic force spectroscopy measurements

• melt by atomic force spectroscopy. We find that the interfacial energy with Ga–In–Sn eutectic melt is a factor two to eight smaller than its surface tension for all asperities. We find that the interfacial energy is influenced by oxidation of the melt at the SiOx–liquid metal alloy interface, which

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

• Berkin Uluutku,
• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 1063–1077, doi:10.3762/bjnano.12.79

• priori. Further research is encouraged on this topic. Conclusion A novel method for obtaining the viscoelastic properties of a material using atomic force spectroscopy has been proposed and demonstrated computationally. The method utilizes Z-transform techniques and yields model-free viscoelastic

Atomic force microscopy as analytical tool to study physico-mechanical properties of intestinal cells

• Christa Schimpel,
• Oliver Werzer,
• Eleonore Fröhlich,
• Gerd Leitinger,
• Markus Absenger-Novak,
• Birgit Teubl,
• Andreas Zimmer and
• Eva Roblegg

Beilstein J. Nanotechnol. 2015, 6, 1457–1466, doi:10.3762/bjnano.6.151

• ], micropipette aspiration [16] and magnetic/optical tweezers or optical traps [17][18][19], atomic force microcopy (AFM) is a versatile and potent tool for studying biological structures [20][21][22]. AFM enables both topographical and force curve measurements (atomic force spectroscopy) [23]. The former allow

• detail, atomic force spectroscopy was used. For local force curve (indentation) measurements, the tip of the cantilever was placed over the location of interest (i.e., peripheral region/cell edge, nuclear area, cell body/cytoplasm) and the mechanical response was recorded as the cantilever was moved

• band pass detection for the red channel and images were examined with CLSM (Zeiss LSM 510 META) equipped with equipped with ZEN software (Zeiss Germany). Atomic force spectroscopy and indentation force measurements The mechanical properties of the cells were obtained via force curve measurements, (i.e

Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM

• Kfir Kuchuk and
• Uri Sivan

Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14

• reconstruct short range forces more accurately than the fundamental harmonic when the oscillation amplitude is small compared with the interaction range. Keywords: atomic force spectroscopy; higher harmonic FM-AFM; Introduction AFM measurements are presently utilized to generate atomic resolution [1][2], 3D

Energy dissipation in multifrequency atomic force microscopy

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

• cross-correlation (XWT) technique in atomic force spectroscopy to reconstruct complex force dynamics in the tip–sample impact regime, when higher cantilever modes are simultaneously excited [5]. The XWT analysis allows to retrieve the displacement, velocity and acceleration of the tip simultaneously for

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

• Jeffrey C. Williams and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

• possibility of carrying out 4-dimensional (4D) atomic force spectroscopy. With the extended spectral inversion method it is theoretically possible to measure the tip–sample forces as a function of the three Cartesian coordinates in the scanning volume (x, y and z) and the vertical velocity of the tip, through

• depicting the force as a function of the tip–surface separation, as is customary in atomic force spectroscopy (see Figure 1, traditional representation). The purpose of this paper is to introduce an extension of the method, such that the forces can be acquired in 4 dimensions (4D), as a function of the

Tip-sample interactions on graphite studied using the wavelet transform

• Giovanna Malegori and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

• has been used in atomic force spectroscopy mainly to denoise or extract data from images [12][13], which is by far the most important application of the wavelet transform. In the following, first we briefly illustrate the Fourier approach to analyze the time traces of the cantilever thermal